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author:"Thomsen M" AND xref_links:"pfam"
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Author by name
- Thomsen M [14]
- Finley M [12]
- Haque T [12]
- Monteagudo E [12]
- Prasad BC [12]
- Thieulin-pardo G [12]
- Vogt TF [12]
- Daub H [9]
- Dominguez C [9]
- Felsenfeld DP [9]
- Iyer RR [9]
- Lee J-H [9]
- Neudegger T [9]
- Plotnikov N [9]
- Steinbacher S [9]
- Sztyler A [9]
- Wilkinson H [9]
- Boudet J [4]
- Aretz J [3]
- Felsenfeld D [3]
- Jeyasankar G [3]
- Salerno-kochan A [3]
- Dedden D [2]
- Gradler U [2]
- Leuthner B [2]
- Nitsche J [2]
- Schneider EV [2]
- Schwarz D [2]
- Dahiya V [1]
- Graedler U [1]
- Haque TS [1]
- Lee JH [1]
- Plotnikov NV [1]
- Schneider E [1]
- Steinbacher SC [1]
- Ulrich G [1]
- Wilkinson HA [1]
Software
Microscope
Electron Source
Film or detector model
Released entries by year
Line chart with 2 lines.
From the search results
The chart has 1 X axis displaying values. Range: since 2006
The chart has 1 Y axis displaying Number of released entries. Range: 0 to 8.
End of interactive chart.
Distribution of resolution values in EMDB
Bar chart with 5 bars.
From the search results
The chart has 1 X axis displaying Resolution (Å).
The chart has 1 Y axis displaying Number of released entries. Range: 0 to 15.
End of interactive chart.
Distribution of EM Methods in EMDB
Pie chart with 1 slice.
From the search results
End of interactive chart.
Distribution of molecular weight in EMDB
Pie chart with 9 slices.
From the search results
End of interactive chart.
Distribution of Sample type in EMDB
Pie chart with 4 slices.
From the search results
End of interactive chart.
Taxonomic distribution
Lineage
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Filter By
Current Database
Current status
Sample type
EM Method
Resolution
Model molecular weight
Author by name
- Thomsen M [14]
- Finley M [12]
- Haque T [12]
- Monteagudo E [12]
- Prasad BC [12]
- Thieulin-pardo G [12]
- Vogt TF [12]
- Daub H [9]
- Dominguez C [9]
- Felsenfeld DP [9]
- Iyer RR [9]
- Lee J-H [9]
- Neudegger T [9]
- Plotnikov N [9]
- Steinbacher S [9]
- Sztyler A [9]
- Wilkinson H [9]
- Boudet J [4]
- Aretz J [3]
- Felsenfeld D [3]
- Jeyasankar G [3]
- Salerno-kochan A [3]
- Dedden D [2]
- Gradler U [2]
- Leuthner B [2]
- Nitsche J [2]
- Schneider EV [2]
- Schwarz D [2]
- Dahiya V [1]
- Graedler U [1]
- Haque TS [1]
- Lee JH [1]
- Plotnikov NV [1]
- Schneider E [1]
- Steinbacher SC [1]
- Ulrich G [1]
- Wilkinson HA [1]
Software
Microscope
Electron Source
Film or detector model