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primary_citation_author:"de Taeye SW" AND author_orcid:"0000-0003-4793-7258"
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Author by name
- Aldon Y [10]
- Copps J [10]
- Poniman M [10]
- Sanders RW [10]
- Sliepen K [10]
- Ward AB [10]
- De Taeye Sw [10]
- Van Gils Mj [10]
- Allen JD [6]
- Antanasijevic A [6]
- Bol N [6]
- Cottrell CA [6]
- Crispin M [6]
- Cruz Portillo Vm [6]
- Cupo A [6]
- Derking R [6]
- Klasse PJ [6]
- Lee WH [6]
- Moore JP [6]
- Ozorowski G [6]
- Rantalainen K [6]
- Seabright GE [6]
- Yasmeen A [6]
- Van Den Kerkhof Tlgm [6]
- Van Der Woude P [6]
- Aartse A [4]
- Bijl TPL [4]
- Bontjer I [4]
- Brinkkemper M [4]
- Brouwer PJM [4]
- Burger JA [4]
- Caniels TG [4]
- Capella-pujol J [4]
- Claireaux M [4]
- Grobben M [4]
- Guerra D [4]
- Han J [4]
- Jongejan A [4]
- Kerster G [4]
- Martin IC [4]
- Moerland PD [4]
- Olijhoek W [4]
- Schriek AI [4]
- Snitselaar JL [4]
- Torres JL [4]
- De Bree Gj [4]
- De Gast M [4]
- Van Kampen Ahc [4]
- Van Schaik Bdc [4]
- Van Der Straten K [4]
Author by ORCID
- Aldon Y [10]
- Van Gils Mj [10]
- Copps J [10]
- Lee WH [6]
- Crispin M [6]
- Allen JD [6]
- Van Der Straten K [4]
- Ward AB [4]
- Martin IC [4]
- Caniels TG [4]
- Grobben M [4]
- Sanders RW [4]
- Moerland PD [4]
- Han J [4]
- Capella-pujol J [4]
- Bontjer I [4]
- Jongejan A [4]
- Torres JL [4]
- Sliepen K [4]
- Claireaux M [4]
- Guerra D [4]
Journal
Software
Microscope
Electron Source
Film or detector model
Filter By
Current Database
Current status
Sample type
EM Method
Resolution
Author by name
- Aldon Y [10]
- Copps J [10]
- Poniman M [10]
- Sanders RW [10]
- Sliepen K [10]
- Ward AB [10]
- De Taeye Sw [10]
- Van Gils Mj [10]
- Allen JD [6]
- Antanasijevic A [6]
- Bol N [6]
- Cottrell CA [6]
- Crispin M [6]
- Cruz Portillo Vm [6]
- Cupo A [6]
- Derking R [6]
- Klasse PJ [6]
- Lee WH [6]
- Moore JP [6]
- Ozorowski G [6]
- Rantalainen K [6]
- Seabright GE [6]
- Yasmeen A [6]
- Van Den Kerkhof Tlgm [6]
- Van Der Woude P [6]
- Aartse A [4]
- Bijl TPL [4]
- Bontjer I [4]
- Brinkkemper M [4]
- Brouwer PJM [4]
- Burger JA [4]
- Caniels TG [4]
- Capella-pujol J [4]
- Claireaux M [4]
- Grobben M [4]
- Guerra D [4]
- Han J [4]
- Jongejan A [4]
- Kerster G [4]
- Martin IC [4]
- Moerland PD [4]
- Olijhoek W [4]
- Schriek AI [4]
- Snitselaar JL [4]
- Torres JL [4]
- De Bree Gj [4]
- De Gast M [4]
- Van Kampen Ahc [4]
- Van Schaik Bdc [4]
- Van Der Straten K [4]
Author by ORCID
- Aldon Y [10]
- Van Gils Mj [10]
- Copps J [10]
- Lee WH [6]
- Crispin M [6]
- Allen JD [6]
- Van Der Straten K [4]
- Ward AB [4]
- Martin IC [4]
- Caniels TG [4]
- Grobben M [4]
- Sanders RW [4]
- Moerland PD [4]
- Han J [4]
- Capella-pujol J [4]
- Bontjer I [4]
- Jongejan A [4]
- Torres JL [4]
- Sliepen K [4]
- Claireaux M [4]
- Guerra D [4]
Journal
Software
Microscope
Electron Source
Film or detector model