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primary_citation_author:"de Taeye SW" AND author_orcid:"0000-0003-4793-7258" AND author_name:"Aldon Y"
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Author by name
- Aldon Y [9]
- Copps J [9]
- Poniman M [9]
- Sanders RW [9]
- Sliepen K [9]
- Ward AB [9]
- De Taeye Sw [9]
- Van Gils Mj [9]
- Allen JD [6]
- Antanasijevic A [6]
- Bol N [6]
- Cottrell CA [6]
- Crispin M [6]
- Cruz Portillo Vm [6]
- Cupo A [6]
- Derking R [6]
- Klasse PJ [6]
- Lee WH [6]
- Moore JP [6]
- Ozorowski G [6]
- Rantalainen K [6]
- Seabright GE [6]
- Yasmeen A [6]
- Van Den Kerkhof Tlgm [6]
- Van Der Woude P [6]
- Aartse A [3]
- Bijl TPL [3]
- Bontjer I [3]
- Brinkkemper M [3]
- Brouwer PJM [3]
- Burger JA [3]
- Caniels TG [3]
- Capella-pujol J [3]
- Claireaux M [3]
- Grobben M [3]
- Guerra D [3]
- Han J [3]
- Jongejan A [3]
- Kerster G [3]
- Martin IC [3]
- Moerland PD [3]
- Olijhoek W [3]
- Schriek AI [3]
- Snitselaar JL [3]
- Torres JL [3]
- De Bree Gj [3]
- De Gast M [3]
- Van Kampen Ahc [3]
- Van Schaik Bdc [3]
- Van Der Straten K [3]
Author by ORCID
- Aldon Y [9]
- Van Gils Mj [9]
- Copps J [9]
- Lee WH [6]
- Crispin M [6]
- Allen JD [6]
- Van Der Straten K [3]
- Ward AB [3]
- Martin IC [3]
- Caniels TG [3]
- Grobben M [3]
- Sanders RW [3]
- Moerland PD [3]
- Han J [3]
- Capella-pujol J [3]
- Bontjer I [3]
- Jongejan A [3]
- Torres JL [3]
- Sliepen K [3]
- Claireaux M [3]
- Guerra D [3]
Journal
Software
Microscope
Electron Source
Film or detector model
Filter By
Current Database
Current status
Sample type
EM Method
Resolution
Author by name
- Aldon Y [9]
- Copps J [9]
- Poniman M [9]
- Sanders RW [9]
- Sliepen K [9]
- Ward AB [9]
- De Taeye Sw [9]
- Van Gils Mj [9]
- Allen JD [6]
- Antanasijevic A [6]
- Bol N [6]
- Cottrell CA [6]
- Crispin M [6]
- Cruz Portillo Vm [6]
- Cupo A [6]
- Derking R [6]
- Klasse PJ [6]
- Lee WH [6]
- Moore JP [6]
- Ozorowski G [6]
- Rantalainen K [6]
- Seabright GE [6]
- Yasmeen A [6]
- Van Den Kerkhof Tlgm [6]
- Van Der Woude P [6]
- Aartse A [3]
- Bijl TPL [3]
- Bontjer I [3]
- Brinkkemper M [3]
- Brouwer PJM [3]
- Burger JA [3]
- Caniels TG [3]
- Capella-pujol J [3]
- Claireaux M [3]
- Grobben M [3]
- Guerra D [3]
- Han J [3]
- Jongejan A [3]
- Kerster G [3]
- Martin IC [3]
- Moerland PD [3]
- Olijhoek W [3]
- Schriek AI [3]
- Snitselaar JL [3]
- Torres JL [3]
- De Bree Gj [3]
- De Gast M [3]
- Van Kampen Ahc [3]
- Van Schaik Bdc [3]
- Van Der Straten K [3]
Author by ORCID
- Aldon Y [9]
- Van Gils Mj [9]
- Copps J [9]
- Lee WH [6]
- Crispin M [6]
- Allen JD [6]
- Van Der Straten K [3]
- Ward AB [3]
- Martin IC [3]
- Caniels TG [3]
- Grobben M [3]
- Sanders RW [3]
- Moerland PD [3]
- Han J [3]
- Capella-pujol J [3]
- Bontjer I [3]
- Jongejan A [3]
- Torres JL [3]
- Sliepen K [3]
- Claireaux M [3]
- Guerra D [3]
Journal
Software
Microscope
Electron Source
Film or detector model